X-Ray Diffraction (XRD)

X-ray diffraction is a non-destructive analytical technique useful in the identification of crystalline materials. In this test, an x-ray beam interacts with a specimen and the scattered x-rays experience both constructive and destructive interference. The intensities of the diffracted x-rays when detected at various angles depending on the crystal structure of the specimen and as a result, crystalline materials exhibit their own unique fingerprint.

Clients most often request XRD analysis to determine the identities and crystal structures of their samples.