X-ray diffraction is a non-destructive analytical technique
useful in the identification of crystalline materials. In this test, an x-ray beam interacts with a
specimen and the scattered x-rays experience both constructive and destructive
interference. The intensities of the
diffracted x-rays when detected at various angles depend on the crystal
structure of the specimen and as a result, crystalline materials exhibit their
own unique fingerprint.
often request XRD analysis to determine the identities and crystal structures
of their samples.